 Lean Enterprise Value: Insights from MIT's Lean Aerospace Initiative 
                                            
                                                     by E. Murman,T. Allen,K. Bozdogan,J. Cutcher-Gershenfeld,H. McManus,D. Nightingale,E. Rebentisch,Tom Shields,Fred Stahl,Myles Walton,Joyce Warmkessel,Stanley Weiss,Sheila Widnall
                                        
                                        
                                            Lean Enterprise Value: Insights from MIT's Lean Aerospace Initiative 
                                            
                                                     by E. Murman,T. Allen,K. Bozdogan,J. Cutcher-Gershenfeld,H. McManus,D. Nightingale,E. Rebentisch,Tom Shields,Fred Stahl,Myles Walton,Joyce Warmkessel,Stanley Weiss,Sheila Widnall
                                  
                                            
                                        
                                            
                                                
                                                    
                                                        Lean Enterprise Value: Insights from MIT's Lean Aerospace Initiative
                                                
                                                
                                                 
                                                   by E. Murman,T. Allen,K. Bozdogan,J. Cutcher-Gershenfeld,H. McManus,D. Nightingale,E. Rebentisch,Tom Shields,Fred Stahl,Myles Walton,Joyce Warmkessel,Stanley Weiss,Sheila Widnall
                                              
                                                 
                                                
                                                    
ISBN 13: 9781349429974
                                                
                                                    Format: Paperback
                                                     (344 pages)
                                                    
                                                    
                                                    Publisher: Palgrave Macmillan
                                                    
Published: 01 Jan 2002
                                                    
                                                    
                                                    
  
                    
 
                            
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